- ON-CHIP SELF-TEST CIRCUIT BLOCKS FOR HIGH-SPEED APPLICATIONS
- MS Thesis by EKATERINA LASKIN of UNIVERSITY OF TORONTO
- https://www.eecg.utoronto.ca/~sorinv/theses/laskin_MASc_thesis.pdf
- Great illustrations and discussion.
- Provided two PRBS checkers.
- The first version gave 3 error flags for each bit error if the errors are spaced further than the PRBS order.
- The second version promised to resolve this but my implementation found that consecutive errors were missed.
- Through Google Scholar, found 9 papers that cited this thesis.
- Zhang, Hongguang, and Deng Luo. "A low power 28 Gb/s 27-PRBS Generator and Check With Correlate Dual Outputs in 40 nm Technology." 2017 International Conference on Electronic Industry and Automation (EIA 2017). Atlantis Press, 2017.
- Has a diagram of a PRBS checker that is the same as the first version of Laskin thesis.
- Don't seem concerned about the 3 error flags for each error issue. Not sure if they addressed this.
Wednesday, January 19, 2022
PRBS Checker
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